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Journal Articles

Single ion hit system in heavy ion microbeam apparatus

Kamiya, Tomihiro; *; Tanaka, Ryuichi

Dai-3-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu, p.453 - 456, 1992/00

no abstracts in English

Journal Articles

Microbeam system for study of single event upset of semiconductor devices

Kamiya, Tomihiro; *; Minehara, Eisuke; Tanaka, Ryuichi; Odomari, Iwao*

Nuclear Instruments and Methods in Physics Research B, 64, p.362 - 366, 1992/00

https://doi.org/10.1016/0168-583X(92)95495-D
 Times Cited Count：30 Percentile：91.05(Instruments & Instrumentation)

no abstracts in English

Journal Articles

JAERI heavy ion microbeam system and single ion hit technique

Kamiya, Tomihiro; *; Tanaka, Ryuichi

Proc. of the lst Meeting on the Ion Engineering Society of Japan, p.105 - 110, 1992/00

no abstracts in English

Oral presentation

Reduction of beam diameter formed by 300 keV compact ion microbeam system

Ishii, Yasuyuki; Okubo, Takeru

no journal, , 

no abstracts in English

Oral presentation

Reduction of a beam diameter formed by several hundred keV compact ion microbeam system, 2

Ishii, Yasuyuki; Okubo, Takeru

no journal, , 

no abstracts in English

Oral presentation

Reduction of beam size for several-hundred keV ion microbeam system

Ishii, Yasuyuki; Okubo, Takeru

no journal, , 

no abstracts in English

6 (Records 1-6 displayed on this page)
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